专利内容由知识产权出版社提供
专利名称：CIRCUIT TESTING APPARATUS EMPLOYING
SIGNATURE ANALYSIS
发明人：Michael Whelan申请号：US06/606746申请日：19840625公开号：US04598401A公开日：19860701
摘要：Apparatus is disclosed for testing an electrical circuit by means of signatureanalysis. Responses to a sequence of test patterns from the circuit under test aresupplied to a linear feedback signature register (LFSR) which produces a signature signalat its output representing its current state in dependence upon its prior state and thereceived response signal. A programmed read-only-memory is addressed by these statesignals of the LFSR and produces, at its output, a logical \"1\" signal if the current signaturerepresents a permissible state of the LFSR and a logical \"0\" if the state is not permissible.This checking occurs throughout and during the testing sequence in contrast toconventional signature analysis wherein the comparison only occurs at the end of thetesting sequence.
申请人：SIEMENS CORPORATE RESEARCH & SUPPORT, INC.
代理人：John Francis Moran
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